SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Measuring, Modeling, and Reproducing Material Appearance - A line scan camera based stereo method for high resolution 3D image reconstruction
Ortiz Segovia, Maria V., Urban, Philipp, Allebach, Jan P., Zhang, Pengchang, Takeda, Tomoyuki, Toque, Jay Arre, Murayama, Yusuke, Ide-Ektessabi, AriVolume:
9018
Year:
2014
Language:
english
DOI:
10.1117/12.2038778
File:
PDF, 1000 KB
english, 2014