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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] X-Ray Optics, Instruments, and Missions II - Superpolishing and precision metrology on a metal mandrel and replicated segments for Constellation-X
Content, David A., Saha, Timo T., Petre, Robert, Lyons III, James J., Wright, Geraldine A., Zaniewski, John J., Chan, Kai-Wing, Hoover, Richard B., Walker II, Arthur B. C.Volume:
3766
Year:
1999
Language:
english
DOI:
10.1117/12.363647
File:
PDF, 1.28 MB
english, 1999