SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Remote Sensing in Atmospheric Pollution Monitoring and Control - Validation of MODIS AOD products with 1-km resolution and their application in the study of urban air pollution in Hong Kong
Li, Chengcai, Lau, Alexis K., Mao, Jietai, Chu, Allen, Szykman, JamesVolume:
5547
Year:
2004
Language:
english
DOI:
10.1117/12.561404
File:
PDF, 530 KB
english, 2004