SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis for nonlinear error of improved 2D-PSD and its applications
Li, Tianze, Wang, Shuyun, Tan, Boxue, Yan, Hongmeng, Pan, Junhua, Wyant, James C., Wang, HexinVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783191
File:
PDF, 227 KB
english, 2007