SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San...

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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 25 August 2013)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII - Detection limits for nanoparticles in solution with classical turbidity spectra

Le Blevennec, G., Postek, Michael T., Orji, Ndubuisi George
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Volume:
8819
Year:
2013
Language:
english
DOI:
10.1117/12.2021643
File:
PDF, 345 KB
english, 2013
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