SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optics for Arts, Architecture, and Archaeology V - Terahertz and multispectral imaging of a Tanda painting

Pezzati, Luca, Targowski, Piotr, Jackson, J. Bianca, Melis, Marcello, Walker, Gillian, Giovannacci, David, Miccoli, Matteo, Martos-Levif, Dominique, Bowen, John, Detalle, Vincent
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Volume:
9527
Year:
2015
Language:
english
DOI:
10.1117/12.2184448
File:
PDF, 1.02 MB
english, 2015
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