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Characterization of interface defects in BiFeO3 metal–oxide–semiconductor capacitors deposited by radio frequency magnetron sputtering
Kaya, Senol, Yilmaz, Ercan, Aktag, Aliekber, Seidel, JanVolume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-3174-1
Date:
August, 2015
File:
PDF, 696 KB
english, 2015