Determination of High-Frequency Dielectric Constant and...

Langmuir 2015 / 10 Vol. 31; Iss. 41

Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by Kelvin Probe Force Microscopy

Salomão, Francisco C., Lanzoni, Evandro M., Costa, Carlos A., Deneke, Christoph, Barros, Eduardo B.
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Volume:
31
Language:
english
Journal:
Langmuir
DOI:
10.1021/acs.langmuir.5b01786
Date:
October, 2015
File:
PDF, 3.50 MB
english, 2015
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