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SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation - Changsha/Zhangjiajie, China (Friday 8 August 2014)] Ninth International Symposium on Precision Engineering Measurement and Instrumentation - Non-contact measurement for profile of different diameter micro/mini holes with capacitance sensor
Cui, Junning, Tan, Jiubin, Wen, Xianfang, Zhu, Liyan, Wang, Wen, Lu, Keqing, Fan, ZongweiVolume:
9446
Year:
2015
Language:
english
DOI:
10.1117/12.2180844
File:
PDF, 543 KB
english, 2015