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[IEEE International Conference on Microelectronics - Nis, Serbia (12-14 Sept. 1995)] Proceedings of International Conference on Microelectronics - High temperature storage life (HTSL) and high temperature reverse bias (HTRB) reliability testing of power VDMOSFETs
Tosic, N., Pesic, B., Stojadinovic, N.Volume:
1
Year:
1995
Language:
english
DOI:
10.1109/ICMEL.1995.500882
File:
PDF, 292 KB
english, 1995