SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Design and Testing VI - High-precision three-dimensional coordinate measurement with subwavelength-aperture-fiber point diffraction interferometer
Wang, Yongtian, Du, Chunlei, Sasián, José, Tatsuno, Kimio, Wang, Daodang, Xu, Yangbo, Chen, Xixi, Wang, Fumin, Kong, Ming, Zhao, JunVolume:
9272
Year:
2014
Language:
english
DOI:
10.1117/12.2067999
File:
PDF, 1.18 MB
english, 2014