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SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Material analysis with EUV/XUV radiation using a broadband laser plasma source and optics system
Bayer, A., Barkusky, F., Dette, J.-O., Döring, S., Flöter, B., Peth, C., Mann, K., Hudec, René, Pina, LadislavVolume:
7360
Year:
2009
Language:
english
DOI:
10.1117/12.822585
File:
PDF, 1.22 MB
english, 2009