SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV - Correlation of dislocations and Te inclusions in detector-grade CdZnTe crystals grown by MVB method
Xu, Yadong, He, Yihui, Xu, Lingyan, Wang, Tao, Zha, Gangqiang, Jie, Wanqi, James, Ralph B., Burger, Arnold, Franks, Larry A., Fiederle, MichaelVolume:
8507
Year:
2012
Language:
english
DOI:
10.1117/12.928176
File:
PDF, 868 KB
english, 2012