X-ray diffraction peak broadening and degradation in LaNi5-based alloys
Y Nakamura, K Oguro, I Uehara, E AkibaVolume:
25
Year:
2000
Language:
english
Pages:
7
DOI:
10.1016/s0360-3199(99)00066-x
File:
PDF, 306 KB
english, 2000