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Lifetime Degradation on n-type Wafers with Boron-diffused and SiO2/SiN-passivated Surface
Renevier, Clémentine, Fourmond, Erwann, Forster, Maxime, Parola, Stéphanie, Le Coz, Marine, Picard, ErwannVolume:
55
Year:
2014
Language:
english
Journal:
Energy Procedia
DOI:
10.1016/j.egypro.2014.08.082
File:
PDF, 354 KB
english, 2014