[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - Investigation of ultra-thin SiO/sub 2/ gate oxide characteristics
Jingrong Tan,, Xiaoyan Xu,, Wenyu Gao,, Huang Ru,, Zhang Xing,Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/ICSICT.2001.981487
File:
PDF, 296 KB
english, 2001