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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Employing transistor reliability testing as an FA tool for understanding HTOL product BIST failures
Yassine, Abdullah, Blair, Lauren, Seifert, WaylandYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112802
File:
PDF, 470 KB
english, 2015