Line shape analysis of high energy X-ray induced Auger- and...

Line shape analysis of high energy X-ray induced Auger- and photoelectron spectra of thin Cu and Ni films

Wolfgang S.M. Werner, László Kövér, József Tóth, Dezsó Varga
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Volume:
122
Year:
2002
Language:
english
Pages:
12
DOI:
10.1016/s0368-2048(01)00347-4
File:
PDF, 290 KB
english, 2002
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