Soft X-ray emission and absorption spectroscopy for electronic structure analysis of cubic silicon clusters in Si K-shell threshold
Yasuji Muramatsu, Munehiro Sugiyama, Satoshi Maeyama, Kazuaki Furukawa, Keisuke Ebata, Masaie Fujino, Nobuo Matsumoto, Susumu Kawai, Muneyuki MotoyamaVolume:
85
Year:
1997
Language:
english
Pages:
7
DOI:
10.1016/s0368-2048(97)00038-8
File:
PDF, 226 KB
english, 1997