Surface analysis of CVD carbon using NEXAFS, XPS and TEM
J. Kikuma, K. Yoneyama, M. Nomura, T. Konishi, T. Hashimoto, R. Mitsumoto, Y. Ohuchi, K. SekiVolume:
88-91
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0368-2048(97)00220-x
File:
PDF, 1.51 MB
english, 1998