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Resonant inelastic soft X-ray scattering at the Si L3 edge: experiment and theory
S. Eisebitt, J. Lüning, J.-E. Rubensson, A. Settels, P.H. Dederichs, W. Eberhardt, S.N. Patitsas, T. TiedjeVolume:
93
Year:
1998
Pages:
6
DOI:
10.1016/s0368-2048(98)00182-0
File:
PDF, 449 KB
1998