![](/img/cover-not-exists.png)
The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy
G.L Fisher, A Hooper, R.L Opila, D.R Jung, D.L Allara, N WinogradVolume:
98-99
Year:
1999
Language:
english
Pages:
10
DOI:
10.1016/s0368-2048(98)00283-7
File:
PDF, 247 KB
english, 1999