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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Functional memory faults: a formal notation and a taxonomy
van de Goor, Ad.J., Al-Ars, Z.Year:
2000
Language:
english
DOI:
10.1109/VTEST.2000.843856
File:
PDF, 273 KB
english, 2000