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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] Advances in X-ray Free-Electron Lasers Instrumentation III - Design and characterization of the ePix10k: a high dynamic range integrating pixel ASIC for LCLS detectors
Biedron, Sandra G., Caragiulo, P., Dragone, A., Markovic, B., Herbst, R., Nishimura, K., Reese, B., Herrmann, S., Hart, P., Blaj, G., Segal, J., Tomada, A., Hasi, J., Carini, G., Kenney, C., Haller, GVolume:
9512
Year:
2015
Language:
english
DOI:
10.1117/12.2182193
File:
PDF, 495 KB
english, 2015