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[IEEE 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering (CMCE 2010) - Changchun, China (2010.08.24-2010.08.26)] 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering - Surface roughness measurement based on image comparison

Dong, Zhi-guo, Deng, Yong -jun, Li, Yuan-zong
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Year:
2010
Language:
english
DOI:
10.1109/CMCE.2010.5609960
File:
PDF, 1.08 MB
english, 2010
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