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SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 9 August 2015)] Nanoimaging and Nanospectroscopy III - Microscopic ellipsometry image of microspheres on a substrate
Verma, Prabhat, Egner, Alexander, Hsiao, F.-C., Chen, Yu-Da, Ngo, Trong H. B., Xie, Huai-Yi, Chang, Yia-ChungVolume:
9554
Year:
2015
Language:
english
DOI:
10.1117/12.2188150
File:
PDF, 3.51 MB
english, 2015