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SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - Nanoparticle detection by microfluidic resistive pulse sensor with optical evidence
Zhang, Hongpeng, Song, Yongxin, Pan, Xinxiang, Sun, Yuqing, Li, Dongqing, Jiang, Jihai, Xin, Jiezhi, Zhu, Lianqing, Wang, ZhongyuVolume:
7997
Year:
2011
Language:
english
DOI:
10.1117/12.888782
File:
PDF, 348 KB
english, 2011