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Extremely Scaled 3-Dimensional Multiple-Gate Technologies for Terabit Era
Choi, Yang-Kyu, Kim, Kuk-Hwan, Han, Jin-Woo, Ryu, Seong-Wan, Lee, HyunjinVolume:
7
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2007.104
Date:
November, 2007
File:
PDF, 490 KB
english, 2007