![](/img/cover-not-exists.png)
[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ, USA (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - A novel new gate charge measurement method
Mikata, Atsushi, Kakitani, Hisao, Takeda, Ryo, Wadsworth, AlanYear:
2015
Language:
english
DOI:
10.1109/ICMTS.2015.7106124
File:
PDF, 471 KB
english, 2015