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[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Calculation of power-supply-induced jitter at a 3-D IC channel including ESD protection circuits
Park, Eunkyeong, Kim, Jingook, Lee, Jongjoo, Park, YoungwooYear:
2015
Language:
english
DOI:
10.1109/ISEMC.2015.7256360
File:
PDF, 1.22 MB
english, 2015