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[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Methodology for optimizing ESD protection for high speed LVDS based I/Os
Abhinav, Vishnuram, Chatterjee, Amitabh, Sinha, Dheeraj Kumar, Singh, RajanYear:
2015
Language:
english
DOI:
10.1109/ISVDAT.2015.7208096
File:
PDF, 3.27 MB
english, 2015