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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - Stitching interferometry: recent results and absolute calibration
Bray, Michael, Geyl, Roland, Rimmer, David, Wang, LingliVolume:
5252
Year:
2004
Language:
english
DOI:
10.1117/12.516164
File:
PDF, 665 KB
english, 2004