A New and Fast Approach to Very Large Scale Integrated...

A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation

J. B. Adams and D. S. Hochbaum
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Volume:
45
Language:
english
Journal:
Operations Research
DOI:
10.2307/172069
Date:
November, 1997
File:
PDF, 523 KB
english, 1997
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