[IEEE 2015 10th IEEE International Symposium on Industrial...

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[IEEE 2015 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - Siegen, Germany (2015.6.8-2015.6.10)] 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - Model checking of finite-state machine-based scenario-aware dataflow using timed automata

Skelin, Mladen, Wognsen, Erik Ramsgaard, Olesen, Mads Chr., Hansen, Rene Rydhof, Larsen, Kim Guldstrand
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Year:
2015
Language:
english
DOI:
10.1109/SIES.2015.7185065
File:
PDF, 449 KB
english, 2015
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