[IEEE 2015 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - Siegen, Germany (2015.6.8-2015.6.10)] 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - Model checking of finite-state machine-based scenario-aware dataflow using timed automata
Skelin, Mladen, Wognsen, Erik Ramsgaard, Olesen, Mads Chr., Hansen, Rene Rydhof, Larsen, Kim GuldstrandYear:
2015
Language:
english
DOI:
10.1109/SIES.2015.7185065
File:
PDF, 449 KB
english, 2015