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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Study of high-dose x-ray radiation damage of silicon sensors
Schwandt, Joern, Fretwurst, Eckhart, Klanner, Robert, Pintilie, Ioana, Zhang, Jiaguo, Juha, Libor, Bajt, Saša, London, Richard, Hudec, René, Pina, LadislavVolume:
8777
Year:
2013
Language:
english
DOI:
10.1117/12.2019514
File:
PDF, 464 KB
english, 2013