Common Metal Die Attachment for SiC Power Devices Operated in an Extended Junction Temperature Range
Tanimoto, Satoshi, Matsui, Kohei, Zushi, Yusuke, Sato, Shinji, Murakami, Yoshinori, Takamori, Masato, Iseki, TakashiVolume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.853
Date:
May, 2012
File:
PDF, 500 KB
english, 2012