Investigation of Ti Layer Thickness Dependent Structural,...

Investigation of Ti Layer Thickness Dependent Structural, Magnetic, and Photoemission Study of Nanometer Range Ti/Ni Multilayer Structures

Bhatt, Pramod, Prakash, Ram, Chaudhari, S. M., Reddy, V. R., Phase, D. M.
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Volume:
7
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2007.773
Date:
June, 2007
File:
PDF, 310 KB
english, 2007
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