Pump–probe spectroscopy of low-temperature grown GaAs for carrier lifetime estimation: arsenic pressure dependence of carrier lifetime during MBE crystal growth
Ryuzi Yano, Yoshiro Hirayama, Sen Miyashita, Hiroyuki Sasabu, Naoshi Uesugi, Shingo UeharaVolume:
289
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0375-9601(01)00591-6
File:
PDF, 83 KB
english, 2001