[IEEE 2015 10th Asia-Pacific Symposium on Information and Telecommunication Technologies (APSITT) - Colombo, Sri Lanka (2015.8.4-2015.8.7)] 2015 10th Asia-Pacific Symposium on Information and Telecommunication Technologies (APSITT) - Helping testers by fault-prone functionality prediction
Tabata, Keiichi, Tanno, Haruto, Oinuma, MorihideYear:
2015
Language:
english
DOI:
10.1109/APSITT.2015.7217084
File:
PDF, 300 KB
english, 2015