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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Systems Contamination: Prediction, Measurement, and Control 2014 - Evaluating the bakeout effectiveness of RTV-S691 silicone adhesive by measuring outgassing rate

Carosso, Nancy, Egges, Joanne, Miyazaki, Eiji, Miura, Yuka, Numata, Osamu, Yamanaka, Riyo, Baba, Susumu, Ishizawa, Junichiro, Kimoto, Yugo, Tamura, Takashi
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Volume:
9196
Year:
2014
Language:
english
DOI:
10.1117/12.2061774
File:
PDF, 1.62 MB
english, 2014
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