SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Methods for Arts and Archaeology - Interferometric fringes projection system for 3D profilometry and relief investigation

Moreau, Vincent, Laboury, Dimitri, Tilkens, Bernard, Renotte, Yvon L. M., Salimbeni, Renzo, Pezzati, Luca
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Volume:
5857
Year:
2005
Language:
english
DOI:
10.1117/12.612949
File:
PDF, 829 KB
english, 2005
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