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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - A new type of wide spectral coverage echelle spectrometer design for ICP-AES
Chen, Shaojie, Tang, Yuguo, Bayanheshig, X., Qi, Xiangdong, Zhu, Wenyu, Wang, Yongtian, Du, Chunlei, Hua, Hong, Tatsuno, Kimio, Urbach, H. PaulVolume:
8557
Year:
2012
Language:
english
DOI:
10.1117/12.999677
File:
PDF, 375 KB
english, 2012