[IEEE 2014 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2014.10.14-2014.10.16)] 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Imagery-based modeling of social, economic, and governance indicators in sub-Saharan Africa

Irvine, John, Kimball, Jennessa, Lepanto, Janet, Regan, John, Wood, Richard
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Year:
2014
Language:
english
DOI:
10.1109/aipr.2014.7041911
File:
PDF, 3.41 MB
english, 2014
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