![](/img/cover-not-exists.png)
Electrical Characterization of Silicon Tips Using Conducting Atomic Force Microscopy
Xiao, Xinxing, Xiao, Zhongdang, Lu, ZuhongVolume:
5
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2005.207
Date:
August, 2005
File:
PDF, 92 KB
english, 2005