Electrical Characterization of Silicon Tips Using...

Electrical Characterization of Silicon Tips Using Conducting Atomic Force Microscopy

Xiao, Xinxing, Xiao, Zhongdang, Lu, Zuhong
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Volume:
5
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2005.207
Date:
August, 2005
File:
PDF, 92 KB
english, 2005
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