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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Polarization Science and Remote Sensing VII - Remotely sensing the photochemical reflectance index, PRI
Shaw, Joseph A., LeMaster, Daniel A., Vanderbilt, Vern, Daughtry, Craig, Dahlgren, RobertVolume:
9613
Year:
2015
Language:
english
DOI:
10.1117/12.2187160
File:
PDF, 702 KB
english, 2015