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Characterizing Atomic Force Microscopy Tip Shape in Use
Wang, Chunmei, Itoh, Hiroshi, Sun, Jielin, Hu, Jun, Shen, Dianhong, Ichimura, ShingoVolume:
9
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2009.c028
Date:
February, 2009
File:
PDF, 1.88 MB
english, 2009