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[IEEE 2015 American Control Conference (ACC) - Chicago, IL, USA (2015.7.1-2015.7.3)] 2015 American Control Conference (ACC) - Estimator based multi-eigenmode control of cantilevers in multifrequency Atomic Force Microscopy
Schuh, Andreas, Bozchalooi, Iman Soltani, Rangelow, Ivo W., Youcef-Toumi, KamalYear:
2015
Language:
english
DOI:
10.1109/ACC.2015.7171011
File:
PDF, 1.77 MB
english, 2015