[IEEE 2015 73rd Annual Device Research Conference (DRC) -...

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[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Surface oxide content examination of capping boron layers in UV photodetectors

Mohammadi, V., Rao, P.R., van de Kruijs, R.W.E., Nihtianov, S.
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Year:
2015
Language:
english
DOI:
10.1109/DRC.2015.7175562
File:
PDF, 752 KB
english, 2015
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