[IEEE 2015 IEEE International Instrumentation and...

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[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms

Renczes, B., Kollar, I., Carbone, P., Moschitta, A., Palfi, V., Virosztek, T.
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Year:
2015
Language:
english
DOI:
10.1109/I2MTC.2015.7151529
File:
PDF, 731 KB
english, 2015
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