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[IEEE 2014 9th International Design & Test Symposium (IDT) - Algeries, Algeria (2014.12.16-2014.12.18)] 2014 9th International Design and Test Symposium (IDT) - Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses
Chenouf, Amel, Djezzar, Boualem, Benadelmoumene, Abdelmadjid, Tahi, Hakim, Goudjil, MohamedYear:
2014
Language:
english
DOI:
10.1109/IDT.2014.7038602
File:
PDF, 613 KB
english, 2014